ASIC Design Engineering

Will you help us design future generations of revolutionary Apple products? Imagine what you could do here. At Apple, new insights have a way of becoming outstanding products, services, and customer experiences very quickly. Every single day, people do amazing things at Apple. You will become part of a hands-on development team that furthers engineering perfection, creativity and innovation. Multifaceted, encouraging people and innovative technologies are the norm here. We want you to join our team if you are an innovative engineer with the dream to research and develop solutions that do not yet exist. Join us!

Description

In this highly visible role, you will be at the centre of a System-on-Chip design effort collaborating with all fields, with a critical impact on getting functional products to millions of customers quickly. Join us!
Responsibilities:
Responsibilities include especially, but are not limited to: Lead the complete DfT solutions in a chip design by working with chip DfT team to detail DfT specifications, and define the SoC test interface Develop and implement DfT architecture as well as generate structural test vectors, analyze and improve coverage Work with the validation team, the design team and testing team for different DfT topics.

Requirements

You have experience developing DfT specifications and driving DfT architecture and methods for designs.
You are confident with Verilog and / or VHDL, and have experience with simulators and waveform debugging tools.
By now you are demonstrating proven understanding of design verification (DV) methodologies for validating DfT implementation in simulation pre-silicon.
You have experienced with STA constraints development and analysis for DfT modes and SDF simulations.
You love conducting experiments during silicon debug, capturing and analysing data; and utilise scripting to support efficient handling of ATE data.
We are counting on your expertise and knowledge about industrial standards and practices in DfT, including ATPG (debug, compressed patterns), JTAG/1500 debug, MBIST and trade-offs between test quality and test time.

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